Zigzag ZnS thin films prepared by thermal evaporation method using glancing angle deposition (GLAD) technique. ZnS films with zigzag structure were produced at deposition angles of 0˚, 60˚ and 80˚ at room temperature on glass substrates. Surface morphology of the films w::as char::acterized by using field emission scanning electron microscopy (FESEM). The optical properties of the specimens were investigated by using UV-Vis spectroscopy technique. To characterize the porosity of the simulated structures, the PoreSTAT software which analyses the NASCAM software was employed. The optical transmissions of the samples were calculated by using NASCAM optics package. The simulation results are completely in agreement with the experimental results.